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PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Lensless single-exposure super-resolved interferometric microscopy
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878808 (May 13, 2013);  doi:10.1117/12.2020580
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
A space-borne fiber-optic interrogator module based on narrow-band tunable laser diode for temperature monitoring in telecommunication satellites
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878810 (May 13, 2013);  doi:10.1117/12.2020495
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Methods to obtain the waveform profile from slope measurements
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881F (May 13, 2013);  doi:10.1117/12.2020534
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Development of alignment-guidance device for grooved roll mill using parallel projection imaging technique
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87881K (May 13, 2013);  doi:10.1117/12.2020332
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Comparison of Michelson and Linnik interference microscopes with respect to measurement capabilities and adjustment efforts
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882G (May 13, 2013);  doi:10.1117/12.2020250
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Dual view x-ray inspection system for foreign objects detection in canned food
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882R (May 13, 2013);  doi:10.1117/12.2021032
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Automatic unit for measuring refractive index of air based on Ciddor equation and its verification using direct interferometric measurement method
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878837 (May 13, 2013);  doi:10.1117/12.2020756
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Alignment of a large outdoor antenna surface using a laser tracker
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878839 (May 13, 2013);  doi:10.1117/12.2020747
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
Sensitivity analysis of tilted-wave interferometer asphere measurements using virtual experiments
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Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878907 (May 13, 2013);  doi:10.1117/12.2019986
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
Efficient and stable numerical method for evaluation of Zernike polynomials and their Cartesian derivatives
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Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878913 (May 13, 2013);  doi:10.1117/12.2020389

BOOKS

Field Guide to Adaptive Optics
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Field Guide to Interferometric Optical Testing
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