Data Processing

PROCEEDINGS & JOURNAL ARTICLES

Journal of Micro/Nanolithography, MEMS, and MOEMS  |  Special Section on Control of Integrated Circuit Patterning Variance Part 1: Metrology, Process Monitoring, and Control of Critical Dimension
July 03, 2015
J. Micro/Nanolith. MEMS MOEMS. 14 (2), 021107 (July 03, 2015);  doi:10.1117/1.JMM.14.2.021107

Journal of Applied Remote Sensing  |  Remote Sensing Applications and Decision Support
July 02, 2015
J. Appl. Remote Sens. 9 (1), 096033 (July 02, 2015);  doi:10.1117/1.JRS.9.096033

Proceedings Volume 9631 (Seventh International Conference on Digital Image Processing (ICDIP 2015)) >
July 01, 2015
Proc SPIE. 9631, Seventh International Conference on Digital Image Processing (ICDIP 2015), 96312H (July 1, 2015);  doi:10.1117/12.2196919

Proceedings Volume 9631 (Seventh International Conference on Digital Image Processing (ICDIP 2015)) >
July 01, 2015
Proc SPIE. 9631, Seventh International Conference on Digital Image Processing (ICDIP 2015), 96312J (July 1, 2015);  doi:10.1117/12.2197092

Proceedings Volume 9631 (Seventh International Conference on Digital Image Processing (ICDIP 2015)) >
July 01, 2015
Proc SPIE. 9631, Seventh International Conference on Digital Image Processing (ICDIP 2015), 96311U (July 1, 2015);  doi:10.1117/12.2197326

Proceedings Volume 9655 (Fifth Asia-Pacific Optical Sensors Conference) >
July 01, 2015
Proc SPIE. 9655, Fifth Asia-Pacific Optical Sensors Conference, 96553M (July 1, 2015);  doi:10.1117/12.2184440

Proceedings Volume 9527 (Optics for Arts, Architecture, and Archaeology V) >
June 30, 2015
Proc SPIE. 9527, Optics for Arts, Architecture, and Archaeology V, 95270M (June 30, 2015);  doi:10.1117/12.2184802

Proceedings Volume 9529 (Optical Methods for Inspection, Characterization, and Imaging of Biomaterials II) >
June 22, 2015
Proc SPIE. 9529, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials II, 95290V (June 22, 2015);  doi:10.1117/12.2184535

Proceedings Volume 9525 (Optical Measurement Systems for Industrial Inspection IX) >
June 22, 2015
Proc SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX, 952533 (June 22, 2015);  doi:10.1117/12.2184578

Proceedings Volume 9525 (Optical Measurement Systems for Industrial Inspection IX) >
June 22, 2015
Proc SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX, 95254B (June 22, 2015);  doi:10.1117/12.2184918

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