Data Processing

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 9573 (Optomechanical Engineering 2015) >
September 02, 2015
Proc SPIE. 9573, Optomechanical Engineering 2015, 95730M (September 2, 2015);  doi:10.1117/12.2186451

Proceedings Volume 9611 (Imaging Spectrometry XX) >
September 01, 2015
Proc SPIE. 9611, Imaging Spectrometry XX, 96110D (September 1, 2015);  doi:10.1117/12.2189889

Proceedings Volume 9576 (Applied Advanced Optical Metrology Solutions) >
September 01, 2015
Proc SPIE. 9576, Applied Advanced Optical Metrology Solutions, 95760E (September 1, 2015);  doi:10.1117/12.2189534

Proceedings Volume 9591 (Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV) >
August 31, 2015
Proc SPIE. 9591, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV, 959109 (August 31, 2015);  doi:10.1117/12.2187318

Proceedings Volume 9594 (Medical Applications of Radiation Detectors V) >
August 27, 2015
Proc SPIE. 9594, Medical Applications of Radiation Detectors V, 95940B (August 27, 2015);  doi:10.1117/12.2196032

Proceedings Volume 9597 (Wavelets and Sparsity XVI) >
August 24, 2015
Proc SPIE. 9597, Wavelets and Sparsity XVI, 95971E (August 24, 2015);  doi:10.1117/12.2192003

Journal of Micro/Nanolithography, MEMS, and MOEMS  |  Special Section on Alternative Lithographic Technologies IV
August 11, 2015
J. Micro/Nanolith. MEMS MOEMS. 14 (3), 031212 (August 11, 2015);  doi:10.1117/1.JMM.14.3.031212

Proceedings Volume 9620 (2015 International Conference on Optical Instruments and Technology: Optical Sensors and Applications) >
August 10, 2015
Proc SPIE. 9620, 2015 International Conference on Optical Instruments and Technology: Optical Sensors and Applications, 96200B (August 10, 2015);  doi:10.1117/12.2193508

Proceedings Volume 9623 (2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems) >
August 07, 2015
Proc SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230H (August 7, 2015);  doi:10.1117/12.2193550

Proceedings Volume 9623 (2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems) >
August 07, 2015
Proc SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96231G (August 7, 2015);  doi:10.1117/12.2193746

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