Image Sensors

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 10209 (Image Sensing Technologies: Materials, Devices, Systems, and Applications IV) >
June 09, 2017
Proc SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV, 102090F (June 9, 2017);  doi:10.1117/12.2262669

Proceedings Volume 10231 (Optical Sensors 2017) >
May 16, 2017
Proc SPIE. 10231, Optical Sensors 2017, 102310N (May 16, 2017);  doi:10.1117/12.2262048

Proceedings Volume 10189 (Passive and Active Millimeter-Wave Imaging XX) >
May 11, 2017
Proc SPIE. 10189, Passive and Active Millimeter-Wave Imaging XX, 101890A (May 11, 2017);  doi:10.1117/12.2264610

Proceedings Volume 10180 (Tri-Technology Device Refrigeration (TTDR) II) >
May 05, 2017
Proc SPIE. 10180, Tri-Technology Device Refrigeration (TTDR) II, 101800K (May 5, 2017);  doi:10.1117/12.2262483

Proceedings Volume 10198 (Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXIII) >
May 05, 2017
Proc SPIE. 10198, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXIII, 1019802 (May 5, 2017);  doi:10.1117/12.2262035

Proceedings Volume 10209 (Image Sensing Technologies: Materials, Devices, Systems, and Applications IV) >
May 03, 2017
Proc SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV, 1020916 (May 3, 2017);  doi:10.1117/12.2262224

Proceedings Volume 10212 (Advanced Photon Counting Techniques XI) >
May 01, 2017
Proc SPIE. 10212, Advanced Photon Counting Techniques XI, 102120H (May 1, 2017);  doi:10.1117/12.2277794

Proceedings Volume 10213 (Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017) >
April 28, 2017
Proc SPIE. 10213, Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017, 102130E (April 28, 2017);  doi:10.1117/12.2262912

Proceedings Volume 10209 (Image Sensing Technologies: Materials, Devices, Systems, and Applications IV) >
April 28, 2017
Proc SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV, 1020910 (April 28, 2017);  doi:10.1117/12.2262308

Proceedings Volume 10145 (Metrology, Inspection, and Process Control for Microlithography XXXI) >
March 28, 2017
Proc SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI, 101451R (March 28, 2017);  doi:10.1117/12.2258631

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BOOKS

Image Acquisition and Preprocessing for Machine Vision Systems
Image Acquisition and Preprocessing for Machine Vision Systems
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