Image Sensors

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 10244 (International Conference on Optoelectronics and Microelectronics Technology and Application) >
January 05, 2017
Proc SPIE. 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102440Q (January 5, 2017);  doi:10.1117/12.2263846

Optical Engineering  |  Special Section on Optical Computational Imaging
January 02, 2017
Opt. Eng. 56 (4), 041311 (January 02, 2017);  doi:10.1117/1.OE.56.4.041311

Proceedings Volume 9944 (Organic Sensors and Bioelectronics IX) >
December 17, 2016
Proc SPIE. 9944, Organic Sensors and Bioelectronics IX, 99440B (December 17, 2016);  doi:10.1117/12.2235900

Proceedings Volume 10023 (Optical Metrology and Inspection for Industrial Applications IV) >
November 24, 2016
Proc SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV, 1002326 (November 24, 2016);  doi:10.1117/12.2247896

Journal of Electronic Imaging  |  Regular Articles
November 23, 2016
J. Electron. Imaging. 25 (6), 063006 (November 23, 2016);  doi:10.1117/1.JEI.25.6.063006

Proceedings Volume 9935 (Solar Hydrogen and Nanotechnology XI) >
November 03, 2016
Proc SPIE. 9935, Solar Hydrogen and Nanotechnology XI, 99350E (November 3, 2016);  doi:10.1117/12.2238697

Proceedings Volume 9969 (Radiation Detectors: Systems and Applications XVII) >
November 02, 2016
Proc SPIE. 9969, Radiation Detectors: Systems and Applications XVII, 996902 (November 2, 2016);  doi:10.1117/12.2238378

Proceedings Volume 10157 (Infrared Technology and Applications, and Robot Sensing and Advanced Control) >
November 01, 2016
Proc SPIE. 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control, 101572R (November 1, 2016);  doi:10.1117/12.2247044

Optical Engineering  |  Special Section on Speckle-Based Metrology
October 27, 2016
Opt. Eng. 55 (12), 121729 (October 27, 2016);  doi:10.1117/1.OE.55.12.121729

Proceedings Volume 9685 (8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials) >
October 25, 2016
Proc SPIE. 9685, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; and Smart Structures and Materials, 968502 (October 25, 2016);  doi:10.1117/12.2242261

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