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PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Lensless object scanning holography for diffuse objects
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880D (May 13, 2013);  doi:10.1117/12.2020564
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Robust evaluation of intensity curves measured by confocal microscopies
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880T (May 13, 2013);  doi:10.1117/12.2020551
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Energetic sensitivity of optical-electronic systems based on polychromatic optical equisignal zone
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878836 (May 13, 2013);  doi:10.1117/12.2020757
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Wavelength modulation-based method for interference phase detection with reduced optical complexity
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883C (May 13, 2013);  doi:10.1117/12.2020678
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Implementation of a fringe visibility based algorithm in coherence scanning interferometry for surface roughness measurement
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883G (May 13, 2013);  doi:10.1117/12.2020560
Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Surface normal deblurring caused by conveyor movement for fast surface inspection
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Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87883O (May 13, 2013);  doi:10.1117/12.2020497
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
A method to measure sub nanometric amplitude displacements based on optical feedback interferometry
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Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 878908 (May 13, 2013);  doi:10.1117/12.2019992
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
Measurement based simulation of microscope deviations for evaluation of stitching algorithms for the extension of Fourier-based alignment
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Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 87890G (May 13, 2013);  doi:10.1117/12.2020595
Proceedings Volume 8789 (Modeling Aspects in Optical Metrology IV) >
May 13, 2013
EFPI signal processing method providing picometer-level resolution in cavity length measurement
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Proc SPIE. 8789, Modeling Aspects in Optical Metrology IV, 87890Y (May 13, 2013);  doi:10.1117/12.2020255
Optical Engineering  |  Fiber Optics and Optical Communication
May 13, 2013
Fiber optic extrinsic Fabry–Perot accelerometer using laser emission frequency modulated phase generated carrier demodulation scheme
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Opt. Eng. 52 (5), 055004 (May 13, 2013);  doi:10.1117/1.OE.52.5.055004

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