Lithography & Microelectronics

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 9202 (Photonics Applications for Aviation, Aerospace, Commercial, and Harsh Environments V) >
September 17, 2014
Proc SPIE. 9202, Photonics Applications for Aviation, Aerospace, Commercial, and Harsh Environments V, 92020L (September 17, 2014);  doi:10.1117/12.2064343

Proceedings Volume 9164 (Optical Trapping and Optical Micromanipulation XI) >
September 16, 2014
Proc SPIE. 9164, Optical Trapping and Optical Micromanipulation XI, 916433 (September 16, 2014);  doi:10.1117/12.2061829

Proceedings Volume 9164 (Optical Trapping and Optical Micromanipulation XI) >
September 16, 2014
Proc SPIE. 9164, Optical Trapping and Optical Micromanipulation XI, 91642F (September 16, 2014);  doi:10.1117/12.2063080

Proceedings Volume 9236 (Scanning Microscopies 2014) >
September 16, 2014
Proc SPIE. 9236, Scanning Microscopies 2014, 923618 (September 16, 2014);  doi:10.1117/12.2066220

Proceedings Volume 9236 (Scanning Microscopies 2014) >
September 16, 2014
Proc SPIE. 9236, Scanning Microscopies 2014, 92360R (September 16, 2014);  doi:10.1117/12.2066240

Proceedings Volume 9236 (Scanning Microscopies 2014) >
September 16, 2014
Proc SPIE. 9236, Scanning Microscopies 2014, 92360C (September 16, 2014);  doi:10.1117/12.2068617

Proceedings Volume 9235 (Photomask Technology 2014) >
September 16, 2014
Proc SPIE. 9235, Photomask Technology 2014, 92351W (September 16, 2014);  doi:10.1117/12.2070544

Proceedings Volume 9235 (Photomask Technology 2014) >
September 16, 2014
Proc SPIE. 9235, Photomask Technology 2014, 923515 (September 16, 2014);  doi:10.1117/12.2067892

Proceedings Volume 9235 (Photomask Technology 2014) >
September 16, 2014
Proc SPIE. 9235, Photomask Technology 2014, 92350Y (September 16, 2014);  doi:10.1117/12.2065930

Proceedings Volume 9235 (Photomask Technology 2014) >
September 16, 2014
Proc SPIE. 9235, Photomask Technology 2014, 923525 (September 16, 2014);  doi:10.1117/12.2074473

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