Metrology

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 9836 (Micro- and Nanotechnology Sensors, Systems, and Applications VIII) >
May 25, 2016
Proc SPIE. 9836, Micro- and Nanotechnology Sensors, Systems, and Applications VIII, 98362W (May 25, 2016);  doi:10.1117/12.2223692

Optical Engineering  |  Instrumentation, Techniques, and Measurement
May 23, 2016
Opt. Eng. 55 (5), 054105 (May 23, 2016);  doi:10.1117/1.OE.55.5.054105

Proceedings Volume 9870 (Computational Imaging) >
May 20, 2016
Proc SPIE. 9870, Computational Imaging, 98700A (May 20, 2016);  doi:10.1117/12.2229019

Proceedings Volume 9870 (Computational Imaging) >
May 20, 2016
Proc SPIE. 9870, Computational Imaging, 98700B (May 20, 2016);  doi:10.1117/12.2224316

Proceedings Volume 9870 (Computational Imaging) >
May 20, 2016
Proc SPIE. 9870, Computational Imaging, 98700C (May 20, 2016);  doi:10.1117/12.2222157

Proceedings Volume 9869 (Mobile Multimedia/Image Processing, Security, and Applications 2016) >
May 19, 2016
Proc SPIE. 9869, Mobile Multimedia/Image Processing, Security, and Applications 2016, 986904 (May 19, 2016);  doi:10.1117/12.2224210

Proceedings Volume 9868 (Dimensional Optical Metrology and Inspection for Practical Applications V) >
May 19, 2016
Proc SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 98680A (May 19, 2016);  doi:10.1117/12.2224312

Proceedings Volume 9868 (Dimensional Optical Metrology and Inspection for Practical Applications V) >
May 19, 2016
Proc SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 98680G (May 19, 2016);  doi:10.1117/12.2227146

Proceedings Volume 9868 (Dimensional Optical Metrology and Inspection for Practical Applications V) >
May 19, 2016
Proc SPIE. 9868, Dimensional Optical Metrology and Inspection for Practical Applications V, 98680H (May 19, 2016);  doi:10.1117/12.2220261

Proceedings Volume 9846 (Long-Range Imaging) >
May 18, 2016
Proc SPIE. 9846, Long-Range Imaging, 98460D (May 18, 2016);  doi:10.1117/12.2224122

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