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Interferometry

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 9170 (Nanoengineering: Fabrication, Properties, Optics, and Devices XI) >
August 28, 2014
Proc SPIE. 9170, Nanoengineering: Fabrication, Properties, Optics, and Devices XI, 91701I (August 28, 2014);  doi:10.1117/12.2061191

Proceedings Volume 9170 (Nanoengineering: Fabrication, Properties, Optics, and Devices XI) >
August 28, 2014
Proc SPIE. 9170, Nanoengineering: Fabrication, Properties, Optics, and Devices XI, 91700C (August 28, 2014);  doi:10.1117/12.2060925

Proceedings Volume 9143 (Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave) >
August 28, 2014
Proc SPIE. 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 91435G (August 28, 2014);  doi:10.1117/12.2070373

Proceedings Volume 9143 (Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave) >
August 28, 2014
Proc SPIE. 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 914345 (August 28, 2014);  doi:10.1117/12.2055195

Proceedings Volume 9143 (Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave) >
August 28, 2014
Proc SPIE. 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave, 91433H (August 28, 2014);  doi:10.1117/12.2055016

Proceedings Volume 9173 (Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII) >
August 27, 2014
Proc SPIE. 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 91730B (August 27, 2014);  doi:10.1117/12.2060382

Proceedings Volume 9173 (Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII) >
August 27, 2014
Proc SPIE. 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 917309 (August 27, 2014);  doi:10.1117/12.2063113

Proceedings Volume 9173 (Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII) >
August 27, 2014
Proc SPIE. 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 917304 (August 27, 2014);  doi:10.1117/12.2061954

Optical Engineering  |  Special Section on Optical Frequency Combs
August 27, 2014
Opt. Eng. 53 (12), 122606 (August 27, 2014);  doi:10.1117/1.OE.53.12.122606

Proceedings Volume 9286 (Second International Conference on Applications of Optics and Photonics) >
August 22, 2014
Proc SPIE. 9286, Second International Conference on Applications of Optics and Photonics, 92864E (August 22, 2014);  doi:10.1117/12.2063728

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