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Optical Materials

PROCEEDINGS & JOURNAL ARTICLES

Proceedings Volume 9048 (Extreme Ultraviolet (EUV) Lithography V) >
April 17, 2014
Proc SPIE. 9048, Extreme Ultraviolet (EUV) Lithography V, 90480N (April 17, 2014);  doi:10.1117/12.2048310

Proceedings Volume 9048 (Extreme Ultraviolet (EUV) Lithography V) >
April 17, 2014
Proc SPIE. 9048, Extreme Ultraviolet (EUV) Lithography V, 90482S (April 17, 2014);  doi:10.1117/12.2046587

Proceedings Volume 9063 (Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2014) >
April 10, 2014
Proc SPIE. 9063, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2014, 90630D (April 10, 2014);  doi:10.1117/12.2044930

Proceedings Volume 9063 (Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2014) >
April 10, 2014
Proc SPIE. 9063, Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security 2014, 90631L (April 10, 2014);  doi:10.1117/12.2046630

Proceedings Volume 9061 (Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2014) >
April 10, 2014
Proc SPIE. 9061, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2014, 906136 (April 10, 2014);  doi:10.1117/12.2045199

Proceedings Volume 9062 (Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2014) >
April 10, 2014
Proc SPIE. 9062, Smart Sensor Phenomena, Technology, Networks, and Systems Integration 2014, 90620S (April 10, 2014);  doi:10.1117/12.2044855

Optical Engineering  |  Materials, Photonic Devices, and Sensors
April 10, 2014
Opt. Eng. 53 (4), 047104 (April 10, 2014);  doi:10.1117/1.OE.53.4.047104

Journal of Nanophotonics  |  Special Section on Nanostructured Thin Films VI
April 03, 2014
J. Nanophoton. 8 (1), 083992 (April 03, 2014);  doi:10.1117/1.JNP.8.083992

Proceedings Volume 9050 (Metrology, Inspection, and Process Control for Microlithography XXVIII) >
April 02, 2014
Proc SPIE. 9050, Metrology, Inspection, and Process Control for Microlithography XXVIII, 90501W (April 2, 2014);  doi:10.1117/12.2045319

Proceedings Volume 8987 (Oxide-based Materials and Devices V) >
April 02, 2014
Proc SPIE. 8987, Oxide-based Materials and Devices V, 898719 (April 2, 2014);  doi:10.1117/12.2043704

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