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Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878803 (May 13, 2013);  doi:10.1117/12.2020327

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878807 (May 13, 2013);  doi:10.1117/12.2020542

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87880P (May 13, 2013);  doi:10.1117/12.2020736

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878825 (May 13, 2013);  doi:10.1117/12.2020385

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882N (May 13, 2013);  doi:10.1117/12.2019981

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 87882R (May 13, 2013);  doi:10.1117/12.2021032

Proceedings Volume 8788 (Optical Measurement Systems for Industrial Inspection VIII) >
May 13, 2013
Proc SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII, 878835 (May 13, 2013);  doi:10.1117/12.2020763

Journal of Nanophotonics  |  Special Section on Nanostructured Thin Films: Fundamentals and Applications
May 09, 2013
J. Nanophoton. 7 (1), 073591 (May 09, 2013);  doi:10.1117/1.JNP.7.073591

Proceedings Volume 8772 (Nonlinear Optics and Applications VII) >
May 08, 2013
Proc SPIE. 8772, Nonlinear Optics and Applications VII, 877203 (May 8, 2013);  doi:10.1117/12.2017533

Proceedings Volume 8772 (Nonlinear Optics and Applications VII) >
May 08, 2013
Proc SPIE. 8772, Nonlinear Optics and Applications VII, 877208 (May 8, 2013);  doi:10.1117/12.2017111

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