Optical Surface Analysis Code (OSAC)

R. J. Noll; P. E. Glenn; J. Osantowski

doi:10.1117/12.934136

5 April 1983 Optical Surface Analysis Code (OSAC)

R. J. Noll, P. E. Glenn, J. Osantowski

Proceedings Volume 0362, Scattering in Optical Materials II; (1983) https://doi.org/10.1117/12.934136
Event: 26th Annual Technical Symposium, 1982, San Diego, United States

Abstract

A computer program for the evaluation of surface ripple effects on an optical system is discussed. The program consists of a modification of conventional ray tracing so that the effects of all roughness frequency scales on image quality can be analyzed. The code is designed to deal with image quality problems arising in connection with x-ray telescopes and near normal incidence systems used in the infrared, visible, and near UV parts of the spectrum. The emphasis of the program analysis is on narrow-angle scattering and its effect on image quality. The intent is to provide the optical engineer with a measure of the sensitivity of image quality to various surface characteristics. The paper will highlight some of the unique modeling features of the code and illustrate some system examples.

Citation Download Citation

R. J. Noll, P. E. Glenn, and J. Osantowski "Optical Surface Analysis Code (OSAC)", Proc. SPIE 0362, Scattering in Optical Materials II, (5 April 1983); https://doi.org/10.1117/12.934136

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