Photoelectron Diffraction: Present Applications And Future Prospects

Stephen D Kevan

doi:10.1117/12.939183

27 March 1984 Photoelectron Diffraction: Present Applications And Future Prospects

Stephen D Kevan

Proceedings Volume 0447, Science with Soft X-Rays; (1984) https://doi.org/10.1117/12.939183
Event: 1983 Brookhaven Conference: Science with Soft X-Rays, 1983, Upton, United States

Abstract

The technique of photoelectron diffraction is reviewed with special emphasis on comparisons with LEED and SEXAFS in surface structural determinations. The review is intended to serve as a guide in choosing photoelectron diffraction over these other techniques. The application of the various data acquisition modes to well-defined systems as well as to more complex overlayer structures is demonstrated. In particular, the potential of photo-electron diffraction in structural determinations of molecular and multi-site overlayer systems is emphasized.

Citation Download Citation

Stephen D Kevan "Photoelectron Diffraction: Present Applications And Future Prospects", Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); https://doi.org/10.1117/12.939183

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available