Paper
18 January 1985 Laser Interferometric On-Line Measurement Of Surface Roughness Laboratory And Plant Application In Paper Industry
E. Lorincz, P. Richter, I. Peczeli, F. Engard
Author Affiliations +
Proceedings Volume 0473, Symposium Optika '84; (1985) https://doi.org/10.1117/12.942408
Event: Symposium Optika '84, 1984, Budapest, Hungary
Abstract
Equipment for non-contact on-line determination of surface roughness is presented. Light of a He-Ne laser scattered by the surface of a moving material (e.g.paper) is detected using an interferometer.Laboratory tests gave good correlation between the results of the optical and traditional methods. Plant application made possible to control reproducibility and observe the effect of technological processes.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Lorincz, P. Richter, I. Peczeli, and F. Engard "Laser Interferometric On-Line Measurement Of Surface Roughness Laboratory And Plant Application In Paper Industry", Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); https://doi.org/10.1117/12.942408
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KEYWORDS
Surface roughness

Heterodyning

Interferometry

Analog electronics

Atomic, molecular, and optical physics

Head

Helium neon lasers

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