Beam And Spot Profile Measurement Methods For Optical Storage Systems

Scott D. Wilson; Timothy Reed

doi:10.1117/12.971075

8 February 1985 Beam And Spot Profile Measurement Methods For Optical Storage Systems

Scott D. Wilson, Timothy Reed

Proceedings Volume 0499, Optical Radiation Measurements; (1985) https://doi.org/10.1117/12.971075
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

Convenient measurements of the spatial dimensions of propagating laser beams and submicron focused spots are described, applicable to optical storage systems. Methods for determining accuracy are discussed, together with error analyses. Examples of typical beam and focused spot measurements are presented including Gaussian, non-Gaussian and aberrated spots.

Citation Download Citation

Scott D. Wilson and Timothy Reed "Beam And Spot Profile Measurement Methods For Optical Storage Systems", Proc. SPIE 0499, Optical Radiation Measurements, (8 February 1985); https://doi.org/10.1117/12.971075

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