Paper
3 September 1985 Surface Roughness Metrology By Angular Distributions Of Scattered Light
David E. Gilsinn, Theodore V. Vorburger, E.Clayton Teague, Michael J. MeLay, Charles Giauque, Fredric E. Scire
Author Affiliations +
Proceedings Volume 0525, Measurement and Effects of Surface Defects & Quality of Polish; (1985) https://doi.org/10.1117/12.946338
Event: 1985 Los Angeles Technical Symposium, 1985, Los Angeles, United States
Abstract
On-line industrial inspection of batch manufactured parts requires fast measurement techniques for surface finish quality. In order to develop the measurement basis for these techniques, a system has been built to determine surface roughness by measuring the angular distributions of scattered light. The system incorporates data gathered from the angular distribution instrument and traditional surface stylus instruments. These data are used both as input and as comparison data in order to test various mathematical models of optical scattering phenomena. The object is to develop a mathematical model that uses the angular distribution of scattered light to deduce surface roughness parameters such as Ra and surface wavelength. This paper describes the results of an experiment in which angular scattered data from surfaces with sinusoidal profiles was used to compute the surface R and wavelength. Stylus measurements of these parameters were made separately. A comparative table is given of the computed and measured values. Estimates of uncertainties are also given.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David E. Gilsinn, Theodore V. Vorburger, E.Clayton Teague, Michael J. MeLay, Charles Giauque, and Fredric E. Scire "Surface Roughness Metrology By Angular Distributions Of Scattered Light", Proc. SPIE 0525, Measurement and Effects of Surface Defects & Quality of Polish, (3 September 1985); https://doi.org/10.1117/12.946338
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Cited by 6 scholarly publications.
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KEYWORDS
Scattering

Light scattering

Sensors

Laser scattering

Surface finishing

Data modeling

Manufacturing

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