Scanning Aspherical Surfaces With The Focus-Wavelength Encoded Profilometer

F. Francini; G. Molesini; F. Quercioli; B. Tiribilli

doi:10.1117/12.964477

3 November 1986 Scanning Aspherical Surfaces With The Focus-Wavelength Encoded Profilometer

F. Francini, G. Molesini, F. Quercioli, B. Tiribilli

Proceedings Volume 0645, Optical Manufacturing, Testing and Aspheric Optics; (1986) https://doi.org/10.1117/12.964477
Event: 1986 Technical Symposium Southeast, 1986, Orlando, United States

Abstract

New developments with the focus-wavelength encoded optical profilometer are reported in the area of applications to surface contouring. Longitudinal chromatic dispersion of a suitably designed lens as a probe is exploited to obtain distance information between the probe and the surface. After proper scanning, the surface topography is recovered.

Citation Download Citation

F. Francini, G. Molesini, F. Quercioli, and B. Tiribilli "Scanning Aspherical Surfaces With The Focus-Wavelength Encoded Profilometer", Proc. SPIE 0645, Optical Manufacturing, Testing and Aspheric Optics, (3 November 1986); https://doi.org/10.1117/12.964477

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