Electronic Speckle Pattern Interferometry

Ole J. Lokberg

doi:10.1117/12.939087

15 January 1988 Electronic Speckle Pattern Interferometry

Ole J. Lokberg

Proceedings Volume 0673, Holography Applications; (1988) https://doi.org/10.1117/12.939087
Event: Holography Applications, 1986, Beijing, China

Abstract

The basic principles of electronic speckle pattern interferometry (ESPI) are described, stressing its close similarity to hologram interferometry. The technique's applications for vibration and deformation testing within industrial and medical research are outlined. Future developments are discussed.

Citation Download Citation

Ole J. Lokberg "Electronic Speckle Pattern Interferometry", Proc. SPIE 0673, Holography Applications, (15 January 1988); https://doi.org/10.1117/12.939087

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