Paper
4 February 1988 Exafs/Reflexafs Experiments Using Laser-Produced Plasma X-Ray Sources
R. W. Eason, T. A. Hall, A. Djaoui, C. Jackson, B. Shiwai, D. K. Bradley, A. J. Rankin, S. D. Tabatabaei, G. N . Greaves, S. J. Rose
Author Affiliations +
Abstract
Laser-produced plasma continuum X-ray sources have been generated using the high power VULCAN glass laser system at the SERC Rutherford Appleton Laboratory, and used for a range of X-ray absorption spectroscopic measurements. EXAFS (extended X-ray absorpticn fine structure) spectra have been recorded in transmission mode for various low Z materials using both time-integrated and time-resolved techniques, and experiments have been performed to study ion correlation effects in a strongly coupled plasma via nearest neighbour distance measurement. A reflection geometry has also been demonstrated in which grazing incidence reflection EXAFS (ref lEXAFS) spectra have been recorded, and experiments performed to investigate surface effects occurring during pulsed laser irradiation of thin nickel overlays on silicon. An assessment is made of the usefulness of such experimental methods, and comparisons made with alternative techniques.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. W. Eason, T. A. Hall, A. Djaoui, C. Jackson, B. Shiwai, D. K. Bradley, A. J. Rankin, S. D. Tabatabaei, G. N . Greaves, and S. J. Rose "Exafs/Reflexafs Experiments Using Laser-Produced Plasma X-Ray Sources", Proc. SPIE 0831, X-Rays from Laser Plasmas, (4 February 1988); https://doi.org/10.1117/12.965038
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Cited by 1 scholarly publication.
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KEYWORDS
Aluminum

Silicon

Absorption

Plasma

X-rays

Chemical species

Spectroscopy

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