Polyphenylene Sulfide Dielectric Insulators In X-Ray Preionized XeCl Discharge Lasers

D A Gobeli; D Lorenz; W L Willis

doi:10.1117/12.944388

12 July 1988 Polyphenylene Sulfide Dielectric Insulators In X-Ray Preionized XeCl Discharge Lasers

D A Gobeli, D Lorenz, W L Willis

Proceedings Volume 0894, Gas Laser Technology; (1988) https://doi.org/10.1117/12.944388
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

The physical and chemical degradation of dielectric materials in excimer lasers is generally considered to be one of their primary lifetime limiting factors. Adverse chemical, radiation, thermal, and mechanical environmental factors coupled with the high costs when scaling to multijoule output energies has prompted feasibility testing of new dielectric materials for use in large discharge pumped XeC1 systems currently under development. Glass-filled polyphenylene sulfide (hereafter referred to as PPS)[1] is a modern thermoplastic possessing a number of desirable mechanical and electrical properties that has prompted an investigation for it's use as a dielectric and structural material in x-ray preionized, discharge-pumped XeC1 lasers. Teflon and Kynar, which had been used previously in a number of designs, have good resistance to chemical attack in the discharge environment and good electrical resistance properties, but are mechanically less desirable and can be very costly to incorporate into large, multijoule excimers because of difficulties in their fabrication. PPS is also quite resistant to attack by the active components of XeC1 laser gas, possesses superior mechanical properties to either Teflon or Kynar and is much less costly to incorporate into existing designs.

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D A Gobeli, D Lorenz, and W L Willis "Polyphenylene Sulfide Dielectric Insulators In X-Ray Preionized XeCl Discharge Lasers", Proc. SPIE 0894, Gas Laser Technology, (12 July 1988); https://doi.org/10.1117/12.944388

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KEYWORDS

Dielectrics

Gas lasers

X-rays

Resistance

Excimer lasers

Statistical analysis

FT-IR spectroscopy

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