Improved Techniques For The NPL Hemispherical Reflectometer

F J.J Clarke; J A Larkin

doi:10.1117/12.945578

3 October 1988 Improved Techniques For The NPL Hemispherical Reflectometer

F J.J Clarke, J A Larkin

Proceedings Volume 0917, Recent Developments and Applications of Infrared Analytical Instruments; (1988) https://doi.org/10.1117/12.945578
Event: Sira/SPIE Infrared Meeting, 1988, London, United Kingdom

Abstract

The NPL hemispherical reflectometer/transmissometer can be used to measure a complete set of spectral radiometric properties from 2.5 to 56 micrometres for any kind of sample, whether or not it has a regular component of reflectance or transmittance. A rotatable hemispherical copper mirror focusses radiation from a cylindrical source on to the sample. Systematic errors are caused by radiometric non-linearity from interreflection effects and by temperature changes of the source arising from interreflection and from the necessary purging air current. A custom-built power supply is operated in a constant-load-resistance mode to maintain the source at a constant temperature to within 0.1 K. This allows simplification of the correction procedures, but the use of standard reference samples is still required for calibration service work. A new method of use for absolute measurements employs a supplementary mirror for additional measurements to let the monochromator optics view the source directly, without and with the sample present. The ratio of these readings then provides a simple correction factor for the reflectometer value, allowing immediate calculation of absolute spectral reflectance. Experimental tests show that the method is valid from 2.5 to 36 micrometres with a grating spectrophotometer, but becomes impracticable at longer wavelengths. A Fourier transform instrument has been modified radically to accommodate the hemisphere reflectometer for further tests.

Citation Download Citation

F J.J Clarke and J A Larkin "Improved Techniques For The NPL Hemispherical Reflectometer", Proc. SPIE 0917, Recent Developments and Applications of Infrared Analytical Instruments, (3 October 1988); https://doi.org/10.1117/12.945578

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