Paper
15 February 1989 Deformation Measurements Of Natural Stones In-Situ By Electronic Speckle Pattern Interferometry (ESPI)
H. Neunaber, G. Gulker, K. Hinsch, C. Holscher, A. Kramer
Author Affiliations +
Proceedings Volume 1010, Industrial Inspection; (1989) https://doi.org/10.1117/12.949212
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
Due to the increasing air pollution in recent years, many valuable historical monuments of stone are falling into disrepair. The need arises to study the mechanisms of stone decay in detail. An instrument is described, which should detect damages before they become visible and help, on the other hand, to gain insight into the underlying processes. The technique used is Electronic Speckle Pattern Interferometry (ESPI). First measurements of microscopic wall deformations in a church over a time period of 3 weeks are presented.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. Neunaber, G. Gulker, K. Hinsch, C. Holscher, and A. Kramer "Deformation Measurements Of Natural Stones In-Situ By Electronic Speckle Pattern Interferometry (ESPI)", Proc. SPIE 1010, Industrial Inspection, (15 February 1989); https://doi.org/10.1117/12.949212
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KEYWORDS
Cameras

Image processing

CCD cameras

Interferometry

Inspection

Speckle pattern

Video

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