Paper
15 February 1989 Measurement Of CCD Interpolation Functions In The Subpixel Precision Range
B. Kleinemeier
Author Affiliations +
Proceedings Volume 1010, Industrial Inspection; (1989) https://doi.org/10.1117/12.949242
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
Geometric distortion and the edge response function as the most important features of a CCD position sensor were measured with wide angle objectives. Three subpixel interpolation approaches are experimentally investigated: an "errorless" interpolation, which makes use of a data base containing the measured distortion and edge response data, a linear interpolation, and a parabolic interpolation as approximations.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Kleinemeier "Measurement Of CCD Interpolation Functions In The Subpixel Precision Range", Proc. SPIE 1010, Industrial Inspection, (15 February 1989); https://doi.org/10.1117/12.949242
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Cited by 4 scholarly publications.
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KEYWORDS
Distortion

Sensors

Charge-coupled devices

Objectives

Inspection

CCD image sensors

Imaging systems

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