Presentation + Paper
12 April 2017 Detection of surface cracking in steel pipes based on vibration data using a multi-class support vector machine classifier
S. Mustapha, A. Braytee, L. Ye
Author Affiliations +
Abstract
In this study, we focused at the development and verification of a robust framework for surface crack detection in steel pipes using measured vibration responses; with the presence of multiple progressive damage occurring in different locations within the structure. Feature selection, dimensionality reduction, and multi-class support vector machine were established for this purpose.

Nine damage cases, at different locations, orientations and length, were introduced into the pipe structure. The pipe was impacted 300 times using an impact hammer, after each damage case, the vibration data were collected using 3 PZT wafers which were installed on the outer surface of the pipe. At first, damage sensitive features were extracted using the frequency response function approach followed by recursive feature elimination for dimensionality reduction. Then, a multi-class support vector machine learning algorithm was employed to train the data and generate a statistical model. Once the model is established, decision values and distances from the hyper-plane were generated for the new collected data using the trained model. This process was repeated on the data collected from each sensor. Overall, using a single sensor for training and testing led to a very high accuracy reaching 98% in the assessment of the 9 damage cases used in this study.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Mustapha, A. Braytee, and L. Ye "Detection of surface cracking in steel pipes based on vibration data using a multi-class support vector machine classifier", Proc. SPIE 10168, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2017, 101682K (12 April 2017); https://doi.org/10.1117/12.2258232
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Sensors

Data modeling

Binary data

Feature selection

Semiconducting wafers

Feature extraction

Statistical modeling

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