Light-matter interaction can be controlled at the nanometer scale by designing the photonic environment of an emitter. The quantity that drives light-matter interaction is the Local Density of States (LDOS) that counts the number of modes in which the fluorescent emitter can decay, either by emitting fluorescent photons coupled to the far field (radiative modes), or by giving its energy to the environment (coupling to a dark mode or absorption losses). Depending on the targeted application (e.g. an efficient single photon source or an efficient absorber), it can be interesting to characterize and optimize the radiative and the non-radiative contributions to the local density of states separately. We have recently developed a fluorescent probe atomic force microscope that allows us to bring a fluorescent emitter in the near-field of a nanostructured sample for simultaneous mapping of the sample topography, fluorescence intensity and fluorescence decay rate (proportional to the LDOS) with nanometric precision. In this talk, we will show that this device allows a thorough characterization of the electromagnetic response of plasmonic and dielectric nanoantennas, in 3D. Moreover, we will show a novel method to map the radiative and the non-radiative contributions to the LDOS starting from the simultaneous imaging of the fluorescence intensity and decay rate. Finally, a new device for LDOS mapping at the nanometer scale without the need of scanning parts will be shown.
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