High Pressure Raman Spectroscopy Of TiO[sub]2[/sub] Thin Films

Nancy J. Hess; Gregory J. Exarhos

doi:10.1117/12.951589

5 July 1989 High Pressure Raman Spectroscopy Of TiO₂ Thin Films

Nancy J. Hess, Gregory J. Exarhos

Proceedings Volume 1055, Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology; (1989) https://doi.org/10.1117/12.951589
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

The pressure dependences of the Raman active modes in submicrometer films of the anatase and rutile crystalline phases of TiO2 have been determined at pressures approaching 90 Kbar. Films investigated have been prepared by reactive sputter deposition and sol-gel techniques. Band frequency shifts as a function of applied pressure for the rutile phase are in agreement with measurements from single crystal samples. However, sol-gel films (anatase) exhibit larger frequency shifts than powder or single crystal samples, and do not undergo the expected pressure-induced phase transformation to the Ti02-II phase. This anomalous pressure response is discussed in terms of the complex film microstructure evaluated from TEM cross-sectional measurements.

Citation Download Citation

Nancy J. Hess and Gregory J. Exarhos "High Pressure Raman Spectroscopy Of TiO₂ Thin Films", Proc. SPIE 1055, Raman Scattering, Luminescence and Spectroscopic Instrumentation in Technology, (5 July 1989); https://doi.org/10.1117/12.951589

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