Paper
18 January 2018 Optical properties of thin films cadmium chalcogenide obtained by the RF magnetron sputtering
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Proceedings Volume 10612, Thirteenth International Conference on Correlation Optics; 1061212 (2018) https://doi.org/10.1117/12.2304328
Event: Thirteenth International Conference on Correlation Optics, 2017, Chernivtsi, Ukraine
Abstract
Optical properties of thin films cadmium chalcogenide produced by RF magnetron sputtering of preliminarily synthesized material are studied. Transmission and reflection coefficients are studied in a range from 0.4 to 1.1 μm. On the basis of the experiments of transmission and reflection coefficients the index of refraction and optical width of the bandgap of thin films under study are measured by the Swanepoel's method аnd method based on measuring of the transmission and reflection coefficients. It was found out that there are direct interzone optical transitions in the thin films under study.
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E. V. Maistruk, I. P. Koziarskyi, D. P. Koziarskyi, and G. O. Andrushchak "Optical properties of thin films cadmium chalcogenide obtained by the RF magnetron sputtering", Proc. SPIE 10612, Thirteenth International Conference on Correlation Optics, 1061212 (18 January 2018); https://doi.org/10.1117/12.2304328
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KEYWORDS
Thin films

Cadmium sulfide

Reflection

Cadmium

Chalcogenides

Absorption

Refractive index

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