Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 10661, including the Title Page, Copyright information, Table of Contents, and Conference Committee listing.

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Author(s), “Title of Paper,” in Thermosense: Thermal Infrared Applications XL, edited by Douglas Burleigh, Proceedings of SPIE Vol. 10661 (SPIE, Bellingham, WA, 2018) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510618336

ISBN: 9781510618343 (electronic)

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Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Akhloufi, Moulay A., 05, 0B

Avdelidis, Nicolas P., 0X

Bison, P., 0S

Bodnar, J. L., 10

Bolan, Jeffrey T., 0L

Bortolin, A., 0S

Bragin, A. A., 0W

Cadelano, G., 0S

Chulkov, A. O., 0W

De Filippis, Luigi Alberto Ciro, 0J, 0Y, 0Z

De Finis, Rosa, 0J, 0Y, 0Z

de Vries, J., 0E

Derusova, D. A., 0W

Dobbins, Christopher L., 0L

Doz, S., 03

Dupuy, Th., 10

Duvaut, Th., 10

Ferrarini, G., 0S

Fleming, Kim, 0G

Foucher, P.Y., 03

Galietti, Umberto, 0Y

Genest, Marc, 0V

Gershenson, M., 0O, 0R

Grager, Jan-Carl, 0X

Gregory, Elizabeth D., 0I

Grosse, Christian U., 0X

Guei, Axel-Christian, 0B

Hall, Zachary M., 0L

Hayashi, Masahiro, 0T

Hernandez Valle, Saul, 0M

Horne, Michael R., 0H

Hsieh, Sheng-Jen, 0K, 13

Huff, Roy, 07

Ibarra-Castanedo, Clemente, 0X

Kaczynski, C., 10

Kauppinen, Timo, 14, 16

Käyhkö, Jari, 16

Kostka, Stanislav, 0E

Kovalev, Valentine Yu., 12

Le Noc, G., 10

Madding, Robert P., 11

Maldague, Xavier P. V., 0X

Matula, Jouni, 16

McDaniel, Melissa A., 0L

McIntosh, Gregory, 07

Meilland, Ph., 10

Mizokami, Yoshiaki, 0T

Nagel, Penelope, 0G

Orlove, Gary L., 11

Oswald-Tranta, Beata, 0U

Ouellet, Simon, 0V

Paloniitty, Sauli, 14

Palumbo, Davide, 0J, 0Y

Peltonen, Kari, 16

Peters, Kara, 0M

Posio, Mikko, 14

Rasi, Marko, 16

Roquelet, C., 10

Rossi, Lucile, 05

Sakagami, Takahide, 0T

Serio, Livia Maria, 0J, 0Y, 0Z

Serioznov, A. N., 0W

Sfarra, Stefano, 0X

Shiozawa, Daiki, 0T

Siikanen, Sami, 14, 16

Solehmainen, Kimmo, 16

Takeguchi, Masahiro, 0T

Taram, A., 10

Toulouse, Tom, 05

Trofimov, Vladislav V., 12

Trofimov, Vyacheslav A., 12

Vavilov, V. P., 0W

Waddle, Caleb E., 0L

Watremez, X., 03

Williams, Kevin, 0V

Winfree, William P., 0I

Zalameda, Joseph N., 0H, 0I

Zhang, Hai, 0X

Zhou, Xunfei, 0K, 13

Conference Committee

Symposium Chair

  • Robert Fiete, Harris Corporation (United States)

Symposium Co-chair

  • Jay Kumler, JENOPTIK Optical Systems, LLC (United States)

Conference Chair

  • Douglas Burleigh, La Jolla Cove Consulting (United States)

Conference Co-chair

  • Jaap de Vries, FM Global (United States)

Conference Program Committee

  • Andrea Acosta, Colbert Infrared Services (United States)

  • Nicolas P. Avdelidis, National Technical University of Athens (Greece)

  • Paolo Bison, Consiglio Nazionale delle Ricerche (Italy)

  • Jeff R. Brown, Embry-Riddle Aeronautical University (United States)

  • Fred P. Colbert, Colbert Infrared Services (United States)

  • Amanda K. Criner, Air Force Research Laboratory (United States)

  • Ralph B. Dinwiddie, Oak Ridge National Laboratory (United States)

  • Jason C. Fox, National Institute of Standards and Technology (United States)

  • Sheng-Jen (Tony) Hsieh, Texas A&M University (United States)

  • Herbert Kaplan, Honeyhill Technical Company (United States)

  • Timo T. Kauppinen, Mutsal (Finland)

  • Dennis H. LeMieux, Siemens Power Generation, Inc. (United States)

  • Monica Lopez Saenz, IRCAM GmbH (Germany)

  • Gregory B. McIntosh, Teasdale Consultants Ltd. (Canada)

  • Xavier P. V. Maldague, Université Laval (Canada)

  • Junko Morikawa, Tokyo Institute of Technology (Japan)

  • Gary L. Orlove, FLIR Systems, Inc. (United States)

  • Beata Oswald-Tranta, Montan University Leoben (Austria)

  • G. Raymond Peacock, Temperatures.com, Inc. (United States)

  • Ralph A. Rotolante, Vicon Enterprises Inc. (United States)

  • Andres E. Rozlosnik, SI Termografía Infrarroja (Argentina)

  • Morteza Safai, The Boeing Company (United States)

  • Takahide Sakagami, Kobe University (Japan)

  • Steven M. Shepard, Thermal Wave Imaging, Inc. (United States)

  • Sami Siikanen, VTT Technical Research Center of Finland (Finland)

  • Gregory R. Stockton, Stockton Infrared Thermographic Services, Inc. (United States)

  • Gary E. Strahan, Infrared Cameras, Inc. (United States)

  • Vladimir P. Vavilov, National Research Tomsk Polytechnic University (Russian Federation)

  • Joseph N. Zalameda, NASA Langley Research Center (United States)

Session Chairs

  • 1 Vendor Presentations and Reception: ThermoSense XL

    Andres E. Rozlosnik, SI Termografía Infrarroja (Argentina)

    Sheng-Jen Hsieh, Texas A&M University (United States)

  • 2 Spectral Analysis

    Gregory B. McIntosh, Teasdale Consultants Ltd. (United States)

    Robert Madding, RPM Energy Associates (United States)

  • 3 Research Topics

    Jaap de Vries, FM Global (United States)

    Gary L. Orlove, FLIR Systems, Inc. (United States)

  • 4 Materials Evaluation

    Joseph N. Zalameda, NASA Langley Research Center (United States)

    Ralph A. Rotolante, Vicon Infrared (United States)

  • 5 IR NDT Theory

    Sheng-Jen Hsieh, Texas A&M University (United States)

    Xavier P. V. Maldague, Université Laval (Canada)

  • 6 IR NDT of Civil Structures

    Paolo Bison, Consiglio Nazionale delle Ricerche (Italy)

    Jeff R. Brown, Embry-Riddle Aeronautical University (United States)

    Nicolas P. Avdelidis, National Technical University of Athens (Greece)

  • 7 IR NDT Applications

    Douglas Burleigh, La Jolla Cove Consulting (United States)

    Vladimir P. Vavilov, National Research Tomsk Polytechnic University (Russian Federation)

  • 8 Welding/Manufacturing

    Gregory R. Stockton, Stockton Infrared Thermographic Services, Inc. (United States)

    Gary E. Strahan, Infrared Cameras, Inc. (United States)

  • 9 40th Anniversary Presentation

    Douglas Burleigh, La Jolla Cove Consulting (United States)

    Gregory B. McIntosh, Teasdale Consultants Ltd. (Canada)

  • 10 Biological Applications

    Fred P. Colbert, Colbert Infrared Services, Inc. (United States)

    Takahide Sakagami, Kobe University (Japan)

  • 11 Buildings

    Timo T. Kauppinen, Mutsal (Finland)

    Gregory R. Stockton, Stockton Infrared Thermographic Services, Inc. (United States)

© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 10661", Proc. SPIE 10661, Thermosense: Thermal Infrared Applications XL, 1066101 (16 July 2018); https://doi.org/10.1117/12.2502388
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KEYWORDS
Thermography

Infrared cameras

Infrared radiation

Nondestructive evaluation

Infrared imaging

Imaging systems

Infrared sensors

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