Influence of aberrations and numerical aperture of an illumination microscope objective on the quality of pinhole diffraction wave front

Yuankai Chen; Yongying Yang; Chen Wang; Yao Li; Jian Bai

doi:10.1117/12.2327055

24 July 2018 Influence of aberrations and numerical aperture of an illumination microscope objective on the quality of pinhole diffraction wave front

Yuankai Chen, Yongying Yang, Chen Wang, Yao Li, Jian Bai

Author Affiliations +

Proceedings Volume 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018); 108272L (2018) https://doi.org/10.1117/12.2327055
Event: Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 2018, Shanghai, China

Abstract

Point diffraction interferometer (PDI) uses the nearly ideal spherical wave front diffracted by the pinhole as the reference, thus its measurement accuracy depends mainly on the quality of the diffraction wave front. However, aberrations and numerical aperture (NA) of the microscope objective (micro-objective) used to illuminate the pinhole in PDI can affect the quality of the diffraction wave front and further reduce the measurement accuracy of PDI. It’s necessary to analyze the influence of the micro-objective on the quality of the diffraction wave front detailly. In this paper, numerical simulation of the propagation of the incident light through the pinhole is carried out with the method of the finite difference time domain (FDTD), vector diffraction integral and vector diffraction theory. Then energy transmittance, homogeneity and deformation are obtained, which are used to evaluate the influence of the micro-objective on the quality of the diffraction wave front. These simulation results will provide a reference for rational selection of the micro-objective parameters, contributing to establish PDI system with best measurement accuracy.

Citation Download Citation

Yuankai Chen, Yongying Yang, Chen Wang, Yao Li, and Jian Bai "Influence of aberrations and numerical aperture of an illumination microscope objective on the quality of pinhole diffraction wave front", Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108272L (24 July 2018); https://doi.org/10.1117/12.2327055

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
6 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Diffraction

Wavefronts

Monochromatic aberrations

Geometrical optics

Near field optics

Transmittance

Microscopes

Show All Keywords

Keywords/Phrases

Search In:

Publication Years