Circuit For Testing Modulation Properties Of The Semiconductor Lasers

A. Wolozko; M. Lipinski; P. Korohoda

doi:10.1117/12.953001

30 January 1990 Circuit For Testing Modulation Properties Of The Semiconductor Lasers

A. Wolozko, M. Lipinski, P. Korohoda

Proceedings Volume 1085, Optical Fibres and Their Applications V; (1990) https://doi.org/10.1117/12.953001
Event: Optical Fibers and Their Applications V, 1989, Warsaw, Poland

Abstract

The idea, construction and the basic fundamental properties of the laboratory circuit for fast modulation of the laser diodes are presented. The circuit based on applying of the HP comb generators makes it possible to modulate the diode by a repetitive or pseudorandom sequence. The sequence consists of 1-4 150 ps pulses with 10 ns repetition rate and can be observed with a sampling oscilloscope. The circuit also contains a bias tee allowing an initial polarization of the laser from external current source.

Citation Download Citation

A. Wolozko, M. Lipinski, and P. Korohoda "Circuit For Testing Modulation Properties Of The Semiconductor Lasers", Proc. SPIE 1085, Optical Fibres and Their Applications V, (30 January 1990); https://doi.org/10.1117/12.953001

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