Paper
20 March 2019 Automatic parameter setting for lens aberration control during product lot exposure
Author Affiliations +
Abstract
We have developed an automatic lens control and parameter settings scheme (on-product iLC) for thermal aberration predictive (feedforward) and calibration (feedback) control. Thermal aberration control is essential for critical layers, and lens control parameter setup time reduction is imperative in maximizing scanner uptime. In our experiment, during production lot exposure the new scheme automatically corrected lens control parameters to within sufficient imaging accuracy tolerances, and demonstrated a dramatic reduction in layer setup time compared with the conventional approach, and we will discuss an actual use-case in this paper.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yutaka Kanakutsu, Yukio Koizumi, Hironori Ikezawa, Shigeru Eto, Junji Ikeda, Takenori Takeuchi, Tomoyuki Matsuyama, Edward Stan, and Ronald Hiltunen "Automatic parameter setting for lens aberration control during product lot exposure", Proc. SPIE 10961, Optical Microlithography XXXII, 109610M (20 March 2019); https://doi.org/10.1117/12.2514917
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KEYWORDS
Calibration

Reticles

Actuators

Control systems

Wavefronts

Distortion

Scanners

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