A single-shot near edge x-ray absorption fine structure spectroscopy using double stream gas puff target source

Martin Duda; Przemysław Wachulak; Tomasz Fok; Łukasz Węgrzyński; Alexandr Jančárek; Henryk Fiedorowicz

doi:10.1117/12.2522429

3 January 2019 A single-shot near edge x-ray absorption fine structure spectroscopy using double stream gas puff target source

Martin Duda, Przemysław Wachulak, Tomasz Fok, Łukasz Węgrzyński, Alexandr Jančárek, Henryk Fiedorowicz

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Proceedings Volume 11042, XXII International Symposium on High Power Laser Systems and Applications; 110420T (2019) https://doi.org/10.1117/12.2522429
Event: XXII International Symposium on High Power Laser Systems and Applications, 2018, Frascati, Italy

Abstract

Thin organic samples and silicon nitride membrane were measured by means of a single-shot near edge x-ray absorption fine structure (NEXAFS) spectroscopy, using a laboratory laser produced plasma soft x-ray (SXR) source. High power nanosecond laser pulse from an Nd:YAG laser is interacting with a double stream gas puff target, forming krypton/helium plasma. Efficient emission in the "water window" spectral region and specially designed grazing incidence SXR spectrometer allow one to obtain simultaneously emission spectrum of the source and transmission spectrum of the investigated sample. Calculated absorption spectrum is then independent of source energy fluctuations and mechanical instabilities. Fine structures near the carbon K-α edge of polyethylene terephthalate (PET) film and ascorbic acid sample, as well as features near nitrogen K-α edge of silicon nitride membrane are revealed. Features near carbon absorption edges are compared with a multishot NEXAFS experiment and numerical simulations. Spectral resolution is comparable with early synchrotron measurements.

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Martin Duda, Przemysław Wachulak, Tomasz Fok, Łukasz Węgrzyński, Alexandr Jančárek, and Henryk Fiedorowicz "A single-shot near edge x-ray absorption fine structure spectroscopy using double stream gas puff target source", Proc. SPIE 11042, XXII International Symposium on High Power Laser Systems and Applications, 110420T (3 January 2019); https://doi.org/10.1117/12.2522429

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KEYWORDS

Absorption

Spectroscopy

X-rays

Nitrogen

Absorption spectroscopy

Carbon

Plasma

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