Paper
26 September 2019 High temperature baking process study in advanced mask cleaning
Dejian Li, Fen Xue, Cong Lu, Wenjun Ling, Xuefei Qin, Jie Wang
Author Affiliations +
Abstract
High temperature baking treatment is a method to remove chemical residue on mask before shipping to wafer fab. When developing advanced mask technology, we need to make sure the bake treatment have no side-effect to mask quality. In this investigation, some test has been devised to study the relation between baking process and mask registration, CD movement, repaired point, ion residue and cleaning performance. We also studied how to setup a stable and efficient bake process to make the mask making flow reasonable. The high temperature bake processes was tuned by different temperature, treatment loops setting and was put at different process position to verify the performance. In this paper, OMOG and EAPSM masks were chosen to test by different process condition.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dejian Li, Fen Xue, Cong Lu, Wenjun Ling, Xuefei Qin, and Jie Wang "High temperature baking process study in advanced mask cleaning", Proc. SPIE 11148, Photomask Technology 2019, 1114816 (26 September 2019); https://doi.org/10.1117/12.2536622
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KEYWORDS
Photomasks

Ions

Air contamination

Distortion

Mask making

Image registration

Semiconducting wafers

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