Spatially Multiplexed Optical Correlation For Displacement Mapping In Speckle Metrology

Klaus Hinsch; Wolfgang Arnold

doi:10.1117/12.961704

26 October 1989 Spatially Multiplexed Optical Correlation For Displacement Mapping In Speckle Metrology

Klaus Hinsch, Wolfgang Arnold

Proceedings Volume 1136, Holographic Optics II: Principles and Applications; (1989) https://doi.org/10.1117/12.961704
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

Optical interrogation of double exposure records in speckle metrology or particle image velocimetry is extended beyond the commonly applied generation of Young's diffraction fringes. The combination of two step optical processing (to produce autocorrelation functions) with spatial multiplexing (to generate a whole field of such functions in parallel) presents a purely optical alternative to digital electronic processing. Special concepts are proposed to evaluate records directly as to statistical parameters or to facilitate screening procedures on large sets of records.

Citation Download Citation

Klaus Hinsch and Wolfgang Arnold "Spatially Multiplexed Optical Correlation For Displacement Mapping In Speckle Metrology", Proc. SPIE 1136, Holographic Optics II: Principles and Applications, (26 October 1989); https://doi.org/10.1117/12.961704

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