Paper
11 October 1989 Excimer Lasers For Lithography Applications
Elmar Cullmann
Author Affiliations +
Proceedings Volume 1138, Optical Microlithography and Metrology for Microcircuit Fabrication; (1989) https://doi.org/10.1117/12.961751
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France
Abstract
The advantage of excimer lasers over conventional UV lamps for microlithography will be discussed and the difficulties encountered will be reviewed. The first application of excimer lasers was in contact printing where the short wavelength of 193 nm of ArF is used to produce sub-half-micron resolution typically on GaAs chips. The first use of excimer lasers in the field of projection printing was in the area of reticle manufacturing. 308 nm XeC1 lasers are used in pattern generators to produce the pixels of the reticle pattern. A very promising field of applications is in the domaine of reduction wafer steppers which produce a demagnified image of the reticle on silicon wafer. Despite the numerous problems in designing a DUV stepper, the wafer stepper with excimer laser source seems to be the logical choice for the next generation of highly integrated circuit manufacturing. Finally, a promising but still distant possible application could be a 1 : 1 print using phase conjugation to circumvent the need for highly sophisticated optics between reticle and wafer.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Elmar Cullmann "Excimer Lasers For Lithography Applications", Proc. SPIE 1138, Optical Microlithography and Metrology for Microcircuit Fabrication, (11 October 1989); https://doi.org/10.1117/12.961751
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Excimer lasers

Semiconducting wafers

Lithography

Reticles

Lamps

Optical lithography

Phase conjugation

RELATED CONTENT

Advances In Excimer Laser Lithography
Proceedings of SPIE (September 01 1987)
Shipping, handling, and storage of reticles
Proceedings of SPIE (August 25 1999)
Reticle quality needs for advanced 193-nm lithography
Proceedings of SPIE (September 05 2001)

Back to Top