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A high resolution, curved-crystal spectrometer of compact design is described. It can be adapted to any X-ray source and covers the 0.5 to 10 nm wavelength range. The scanning of spectra is obtained by means of a novel mechanical arrangement using two coaxial rotary stages and a system of rotating arms. (patent nr 86.08871). The step-by-step scanning of spectra is driven by an Apple Ile microcomputer which is also used to perform the data acquisition for X-ray emission, X-ray absorption and isochromat spectra.
C. Senemaud,D. Laporte,J. M. Andre,R. Kherouf,P. Paquier, andM. Ringuenet
"A Versatile Curved-Crystal Spectrometer", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961856
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C. Senemaud, D. Laporte, J. M. Andre, R. Kherouf, P. Paquier, M. Ringuenet, "A Versatile Curved-Crystal Spectrometer," Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961856