Paper
17 April 2020 Detection efficiency calibration of single-photon avalanche detectors
Changming Liu, Xueshun Shi, Pengju Zhang, Xingang Zhuang, Hongbo Liu
Author Affiliations +
Proceedings Volume 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications; 1145505 (2020) https://doi.org/10.1117/12.2557326
Event: Sixth Symposium on Novel Photoelectronic Detection Technology and Application, 2019, Beijing, China
Abstract
The detection efficiency calibration of single-photon avalanche detectors is presented. The detection efficiency is determined from the measurement of the photon count rate and incoming photon flux traceable to reference standard detectors, and corrected by afterpulse probability and dead time. We describe the measurement facilities and the reference standard detectors used, as well as the traceability chain of the measurements to the primary standard detector. As an example, the measurement uncertainty components are determined and analyzed in detail and the obtained combined standard measurement uncertainty is <0.5% at 633nm and 1550nm.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Changming Liu, Xueshun Shi, Pengju Zhang, Xingang Zhuang, and Hongbo Liu "Detection efficiency calibration of single-photon avalanche detectors", Proc. SPIE 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications, 1145505 (17 April 2020); https://doi.org/10.1117/12.2557326
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KEYWORDS
Sensors

Calibration

Single photon detectors

Photodiodes

Silicon

Time correlated photon counting

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