Automatic test system design based on generalization platform

Wei Yan; Peng Zhang; Tao Qi; Shiyong Guo; Baolin Du; Hui Gan

doi:10.1117/12.2565677

17 April 2020 Automatic test system design based on generalization platform

Wei Yan, Peng Zhang, Tao Qi, Shiyong Guo, Baolin Du, Hui Gan

Proceedings Volume 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications; 114558H (2020) https://doi.org/10.1117/12.2565677
Event: Sixth Symposium on Novel Photoelectronic Detection Technology and Application, 2019, Beijing, China

Abstract

Under the background of the test equipment adopting the generalized platform hardware environment, an automatic test system design implementation method is proposed, which will divide the test resource information into test elements such as device library, ICD library, use case library, etc., and refer to the test standard to describe the characteristics and test elements of the language ATML. Classify test case descriptions as standard incentive response commands and use common test software to complete the automated testing process. The automatic test system integrates key test elements such as test data, test strategy and requirements, test steps, test results management, and provides the overall system structure resources, test description, test results, configuration information, public information, etc., and solves a series of problems brought about by manual detection and maintenance.

Citation Download Citation

Wei Yan, Peng Zhang, Tao Qi, Shiyong Guo, Baolin Du, and Hui Gan "Automatic test system design based on generalization platform", Proc. SPIE 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications, 114558H (17 April 2020); https://doi.org/10.1117/12.2565677

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