Electron spectro-microscopy of 2D materials

Jerzy T. Sadowski

doi:10.1117/12.2568816

21 August 2020 Electron spectro-microscopy of 2D materials

Jerzy T. Sadowski

Proceedings Volume 11465, Low-Dimensional Materials and Devices 2020; 114650I (2020) https://doi.org/10.1117/12.2568816
Event: SPIE Nanoscience + Engineering, 2020, Online Only

Abstract

Miniaturization of electronic devices and progress in surface science demand novel, powerful microscopy methods for material characterization on a length scale of only a few atomic distances. This paper discusses application of the combined x-ray photoelectron microscopy / low-energy electron microscopy (XPEEM/LEEM) system to studying of the structural, electronic and chemical properties of surfaces at nanometer scale. Several examples are given, focusing on the comprehensive spectro-microscopic investigations of 2D structures, including epitaxially grown films as well as exfoliated, μm-size thin flakes of 2D van der Waals materials. Benefitting from the high brilliance of the synchrotron, and utilizing its capabilities for in-situ sample preparation and treatment, the XPEEM/LEEM is a powerful tool for comprehensive characterization of static and dynamic properties of surfaces and interfaces, and it is particularly suited for comprehensive investigation of 2D materials, down to single monolayers.

Conference Presentation

Citation Download Citation

Jerzy T. Sadowski "Electron spectro-microscopy of 2D materials", Proc. SPIE 11465, Low-Dimensional Materials and Devices 2020, 114650I (21 August 2020); https://doi.org/10.1117/12.2568816

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