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Speckle patterns are widely used in imaging techniques such as ghost imaging, dynamic speckle illumination microscopy, structured illumination microscopy, and photoacoustic fluctuation imaging. Recent advances in control of speckle statistical properties has enabled the customization of speckle patterns for specific imaging applications. Here, we design and create special speckle patterns for parallelized nonlinear pattern-illumination microscopy based on fluorescence photo-switching. We present a proof-of-principle experimental demonstration where we obtain a spatial resolution three times higher than the diffraction limit of the illumination optics in our setup. Our work establishes that customized speckles are a potent tool in parallelized super-resolution microscopy.
Hui W. Cao
"Circumventing the optical diffraction limit with customized speckles", Proc. SPIE 11700, Optical and Quantum Sensing and Precision Metrology, 117003W (5 March 2021); https://doi.org/10.1117/12.2586488
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Hui W. Cao, "Circumventing the optical diffraction limit with customized speckles," Proc. SPIE 11700, Optical and Quantum Sensing and Precision Metrology, 117003W (5 March 2021); https://doi.org/10.1117/12.2586488