Open Access Paper
5 July 2022 Front Matter: Volume 12053
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 12053, including the Title Page, Copyright information, Table of Contents, and Conference Committee listings.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Metrology, Inspection, and Process Control XXXVI, edited by John C. Robinson, Matthew J. Sendelbach, Proc. of SPIE 12053, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510649811

ISBN: 9781510649828 (electronic)

Published by

SPIE

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Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE).

Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher.

Printed in the United States of America by Curran Associates, Inc., under license from SPIE.

Publication of record for individual papers is online in the SPIE Digital Library.

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Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Symposium Chair

  • Kafai Lai, University of Hong Kong (United States)

Symposium Co-Chair

  • Qinghuang Lin, LAM Research Corporation (United States)

Conference Chair

  • John C. Robinson, KLA Corporation (United States)

Conference Co-Chair

  • Matthew J. Sendelbach, TEL Technology Ctr., America, LLC (United States)

Conference Program Committee

  • Ofer Adan, Applied Materials Israel, Ltd. (Israel)

  • John A. Allgair, BRIDG (United States)

  • Masafumi Asano, Tokyo Electron Ltd. (Japan)

  • Bryan M. Barnes, National Institute of Standards and Technology (United States)

  • Cornel Bozdog, Micron Technology, Inc. (United States)

  • Benjamin D. Bunday, AMAG Consulting, LLC (United States)

  • Xiaomeng Chen, Taiwan Semiconductor Manufacturing Company Ltd. (Taiwan)

  • Hugo Cramer, ASML Netherlands B.V. (Netherlands)

  • Timothy F. Crimmins, Intel Corporation (United States)

  • Shunsuke Koshihara, Hitachi High-Technologies Corporation (Japan)

  • Yi-Sha Ku, Industrial Technology Research Institute (Taiwan)

  • Byoung-Ho Lee, SK hynix, Inc. (Korea, Republic of)

  • Myungjun Lee, SAMSUNG Electronics Co., Ltd. (Korea, Republic of)

  • Philippe Leray, IMEC (Belgium)

  • Narender Rana, Western Digital Corporation (United States)

  • Christopher J. Raymond, Onto Innovation Inc. (United States)

  • Daniel Schmidt, IBM Thomas J. Watson Research Center (United States)

  • Nivea G. Schuch, ASELTA Nanographics (France)

  • Alexander Starikov, I&I Consulting (United States)

  • Alok Vaid, GLOBALFOUNDRIES Inc. (United States)

© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 12053", Proc. SPIE 12053, Metrology, Inspection, and Process Control XXXVI, 1205301 (5 July 2022); https://doi.org/10.1117/12.2643414
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KEYWORDS
Overlay metrology

Metrology

Signal processing

3D image processing

Digital image processing

Scanning electron microscopy

Error analysis

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