The hard x-ray quantum detection efficiency of CsI-coated MCP

Shi-Ming Xiang

doi:10.1117/12.2294653

1 July 1990 The hard x-ray quantum detection efficiency of CsI-coated MCP

Shi-Ming Xiang

Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 12300G (1990) https://doi.org/10.1117/12.2294653
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States

Abstract

An analysis model is presented for dealing with the hard X-ray quantum detection efficiency (XQDE) of a CsI-Coated MCP. It has been proved that the model is in good agreement with the experimental results of XQDE's relation to CsI layer thickness for a series of input X-ray photon energy. Its practical significance and applications have been discussed for our designing hard X- ray wafer image intensifiers using CsI-coated as a refiction mode photocathode.

Citation Download Citation

Shi-Ming Xiang "The hard x-ray quantum detection efficiency of CsI-coated MCP", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12300G (1 July 1990); https://doi.org/10.1117/12.2294653

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