Computerized measurement of synthetic characteristics of microchannel plates

Yinghui Li

doi:10.1117/12.2294713

1 July 1990 Computerized measurement of synthetic characteristics of microchannel plates

Yinghui Li

Proceedings Volume 1230, International Conference on Optoelectronic Science and Engineering '90; 123024 (1990) https://doi.org/10.1117/12.2294713
Event: The Marketplace for Industrial Lasers 1990, 1990, Chicago, IL, United States

Abstract

A computerized measurement has been developed to assess the characteristics of microchannel plate (MCP). This paper discusses the microcomputer hardware and software techniques used in the system in circuit control, signal acquization and software package, etc.. Some measuring results have been presented.

Citation Download Citation

Yinghui Li "Computerized measurement of synthetic characteristics of microchannel plates", Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123024 (1 July 1990); https://doi.org/10.1117/12.2294713

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