Front Matter: Volume 12607

doi:10.1117/12.3011866

4 October 2023 Front Matter: Volume 12607

Proceedings Volume 12607, Optical Technology and Measurement for Industrial Applications Conference; 1260701 (2023) https://doi.org/10.1117/12.3011866
Event: Optics and Photonics International Congress, 2023, Yokohama, Japan

Abstract

This PDF file contains the front matter associated with SPIE Proceedings Volume 12607, including the Title Page, Copyright information, Table of Contents, and Conference Committee information.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Optical Technology and Measurement for Industrial Applications Conference, edited by Takeshi Hatsuzawa, Yukitoshi Otani, Rainer Tutsch, Toru Yoshizawa, Proc. of SPIE 12607, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510663411

ISBN: 9781510663428 (electronic)

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Publication of record for individual papers is online in the SPIE Digital Library.

Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

▪ The first five digits correspond to the SPIE volume number.
▪ The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Conference Chairs

Takeshi Hatsuzawa, Tokyo Institute of Technology (Japan)
Yukitoshi Otani, Utsunomiya University (Japan)
Rainer Tutsch, Technische Universität Braunschweig (Germany)
Toru Yoshizawa, NPO 3D Associates (Japan)

Conference Program Committee

Masato Aketagawa, Nagaoka University of Technology (Japan)
Yasuhiko Arai, Kansai University (Japan)
Prathan Buranasiri, King Mongkut’s Institute of Technology Ladkrabang (Thailand)
Jürgen W. Czarske, TU Dresden (Germany)
Motoharu Fujigaki, University of Fukui (Japan)
Amalia Martínez-García, Centro de Investigaciones en Óptica, A.C. (Mexico)
Satoshi Gonda, National Institute of Advanced Industrial Science and Technology (Japan)
Sen Han, University of Shanghai for Science and Technology (China)
Feng-Lei Hong, Yokohama National University (Japan)
Nathan Hagen, Utsunomiya University (Japan)
Hideki Ina, Canon Inc. (Japan)
Ichiro Ishimaru, Kagawa University (Japan)
Lianhua Jin, University of Yamanashi (Japan)
Daesuk Kim, Chonbuk National University (Korea, Republic of)
Jonathan D. Kofman, University of Waterloo (Canada)
Kazuhide Kamiya, Toyama Prefectural University (Japan)
Qian Kemao, Nanyang Technological University (Singapore)
Ryoichi Kuwano, Hiroshima Institute of Technology (Japan)
Yu-Lung Lo, National Cheng Kung University (Taiwan)
Yasuhiro Mizutani, Osaka University (Japan)
Christian Rembe, Technische Universität Clausthal (Germany)
Pavel Pavlicek, Palacký University Olomouc (Czech Republic)
Takamasa Suzuki, Niigata University (Japan)
Satoru Takahashi, The University of Tokyo (Japan)
Toshitaka Wakayama, Saitama Medical University (Japan)
Wei-Chung Wang, National Tsing Hua University (Taiwan)
Gao Wei, Tohoku University (Japan)
Jiangtao Xi, University of Wollongong (Australia)
Hayato Yoshioka, Tokyo Institute of Technology (Japan)
Song Zhang, Purdue University (United States)

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"Front Matter: Volume 12607", Proc. SPIE 12607, Optical Technology and Measurement for Industrial Applications Conference, 1260701 (4 October 2023); https://doi.org/10.1117/12.3011866

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