Heliostat’s reflected beam quality has been estimated using the target-camera method for years due to being the only method that can be realistically implemented in a commercial plant. But this methodology is prone to errors such as those derived from target surface flaws and its limited size, and the sensitivity and dynamic range of the camera. To reach a high quality characterization, thus reducing required security margins and boosting plant profitability, a novel system and methodology have been developed. This is a scanner-based methodology in which the spot reflected by a static heliostat, no matter how far it is from the measurement system, is captured simultaneously by two subsystems, a vertical array of detectors and a group of cameras, in order to produce a high quality representation of the reflected beam and a precise characterization of the normal vectors along the whole heliostat reflective surface. The use of optoelectronic detectors allows capturing the solar beam with reduced optical and electronical noise and wider dynamic range with respect to the state-of-the-art methodology. At once, the camera subsystem is used as a scanner to perform an accurate normal vector estimation of the heliostat surface. The combination of both approaches lead to the most precise heliostat characterization to date. This system can be implemented at low cost in any commercial plant, planned, under construction or under exploitation with any size of heliostat field and any number and typology of heliostats.
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