Research on the design of DUT board for the V93000 test system

Zhirong He

doi:10.1117/12.2680123

31 May 2023 Research on the design of DUT board for the V93000 test system

Zhirong He

Proceedings Volume 12704, Eighth International Symposium on Advances in Electrical, Electronics, and Computer Engineering (ISAEECE 2023); 1270427 (2023) https://doi.org/10.1117/12.2680123
Event: 8th International Symposium on Advances in Electrical, Electronics and Computer Engineering (ISAEECE 2023), 2023, Hangzhou, China

Abstract

DUT board is an interface between the Device Under Test system for the IC test. This paper describes how to design a DUT board based on the test system’s configuration. To enhance the quality of performance on the DUT board, it also focuses on some methods of electrical design about layers distribution, trace routing, signal filtering for mixed-signal, high-speed signal, and special components for the V93000 test system.

Citation Download Citation

Zhirong He "Research on the design of DUT board for the V93000 test system", Proc. SPIE 12704, Eighth International Symposium on Advances in Electrical, Electronics, and Computer Engineering (ISAEECE 2023), 1270427 (31 May 2023); https://doi.org/10.1117/12.2680123

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