Application of small sample algorithm and meteorological disaster early warning in power grid

Xiangzhou Chen

doi:10.1117/12.2685703

15 August 2023 Application of small sample algorithm and meteorological disaster early warning in power grid

Xiangzhou Chen

Proceedings Volume 12719, Second International Conference on Electronic Information Technology (EIT 2023); 127194G (2023) https://doi.org/10.1117/12.2685703
Event: Second International Conference on Electronic Information Technology (EIT 2023), 2023, Wuhan, China

Abstract

Meteorological disaster early warning has the characteristics of many construction contents, wide coverage, high complexity, and large workload and high difficulty in project construction In this paper, metrological disaster early warning technology and small sample algorithm are introduced to improve the accuracy of metrological disaster early warning, and solve the problems that the existing system can only generalize the prediction, has high false alarm rate and low work efficiency This paper first studies the method of building metrological disaster early warning and metrological disaster early warning, then designs demand analysis and comparative application based on metrological disaster early warning and small sample algorithm, And finally analyzes the effect of comparison between meteorological disaster early warning analysis and small sample algorithm through example comparison The metrological disaster early warning technology and small sample algorithm solve the problem that the current system cannot compare the construction content The results of the example show that the analysis speed of the existing early warning system is obviously better than the current metrological early warning system, and the comparison accuracy of the small sample algorithm is more than 1.13% higher than that of the single similarity algorithm.

Citation Download Citation

Xiangzhou Chen "Application of small sample algorithm and meteorological disaster early warning in power grid", Proc. SPIE 12719, Second International Conference on Electronic Information Technology (EIT 2023), 127194G (15 August 2023); https://doi.org/10.1117/12.2685703

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available