Fault detection of key components based on the TEDS images of electric multiple unit (EMU) undercarriages

Zhen Chen; Duo Hao Pan; Wu Yang Chen

doi:10.1117/12.2689096

31 July 2023 Fault detection of key components based on the TEDS images of electric multiple unit (EMU) undercarriages

Zhen Chen, Duo Hao Pan, Wu Yang Chen

Proceedings Volume 12747, Third International Conference on Optics and Image Processing (ICOIP 2023); 127470R (2023) https://doi.org/10.1117/12.2689096
Event: Third International Conference on Optics and Image Processing (ICOIP 2023), 2023, Hangzhou, China

Abstract

In the fault detection process for electric multiple units (EMU), the detection of faults in undercarriage components has always been a difficult problem. The emergence of the TEDS (a dynamic fault imaging and detection system for EMUs) has made this process easier, but it still cannot eliminate manual processes. In this paper, a method of fault detection based on the features of the histogram of oriented gradients (HOG) and support vector machine (SVM) is proposed to improve the capability of the TEDS to identify and locate faults in key components.This method can reduce latent incidents and improve efficiency,ensure the safe and efficient operation of the system.First, the object to be detected is located by means of edge detection, and the image of the object is segmented and preprocessed. Then, the corresponding HOG features are extracted and processed, and the object is identified using the SVM. Finally, the aforementioned process is used to conduct experiments on fault detection based on EMU undercarriage images and identify faults such as missing and/or loose bolts. The experimental results show that the fault detection rate of the method proposed in this paper meets the system requirements and the proposed method can effectively detect samples in complex environments

Citation Download Citation

Zhen Chen, Duo Hao Pan, and Wu Yang Chen "Fault detection of key components based on the TEDS images of electric multiple unit (EMU) undercarriages", Proc. SPIE 12747, Third International Conference on Optics and Image Processing (ICOIP 2023), 127470R (31 July 2023); https://doi.org/10.1117/12.2689096

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KEYWORDS

Histograms of oriented gradient

Detection and tracking algorithms

Image processing

Edge detection

Gamma correction

Feature extraction

Image segmentation

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