Spatial reconstruction from temporal light field: a new approach for optical 3D metrology

Xinlan Tang; Lingbao Kong

doi:10.1117/12.3009041

29 December 2023 Spatial reconstruction from temporal light field: a new approach for optical 3D metrology

Xinlan Tang, Lingbao Kong

Proceedings Volume 12976, Eighth Asia Pacific Conference on Optics Manufacture and Third International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2023); 1297610 (2023) https://doi.org/10.1117/12.3009041
Event: 8th Asia Pacific Conference on Optics Manufacture & 3rd International Forum of Young Scientists on Advanced Optical Manufacturing, 2023, Shenzhen, China

Abstract

With the advances in scientific foundations and technological implementations, modern industrial design requires more details of object such as 3D information. Most of the optical 3D metrology focus on the spatial distribution of the light field, while weakening its temporal characteristics, which makes additional information lost or causes errors in somewhere. Here, we propose a new approach based on the temporal modulated radiation, actively introduce time perturbation and mine the hidden information in the temporal domain intensity fluctuations of the light field. A temporal cross-correlation function is used to calculate and characterize the related physical quantities of temporal light field, modeling the mapping relationship between the phase gradient of the modulated wave and the gradient of the object surface, and the feasibility of the model is verified by numerical simulation based on ray-tracing method. The proposed approach expands a new perceptive for optical metrology, provides a bridge for the integration of various technologies.

Citation Download Citation

Xinlan Tang and Lingbao Kong "Spatial reconstruction from temporal light field: a new approach for optical 3D metrology", Proc. SPIE 12976, Eighth Asia Pacific Conference on Optics Manufacture and Third International Forum of Young Scientists on Advanced Optical Manufacturing (APCOM and YSAOM 2023), 1297610 (29 December 2023); https://doi.org/10.1117/12.3009041

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KEYWORDS

Specular reflections

3D modeling

Phase shift keying

3D metrology

Modulation

Light sources

3D projection

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