Parameter estimation algorithm based on the combination of cross-correlation and principal component analysis for structured illumination microscopy

Yuxia Huang; Jiaming Qian; Pengfei Fan; Yongtao Liu

doi:10.1117/12.3019593

30 April 2024 Parameter estimation algorithm based on the combination of cross-correlation and principal component analysis for structured illumination microscopy

Yuxia Huang, Jiaming Qian, Pengfei Fan, Yongtao Liu

Author Affiliations +

Proceedings Volume 13153, Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Technologies in Optical Systems; 131531G (2024) https://doi.org/10.1117/12.3019593
Event: Sixth Conference on Frontiers in Optical Imaging Technology and Applications (FOI2023), 2023, Nanjing, JS, China

Abstract

Structured illumination microscopy (SIM) is more applicable to the super-resolution imaging of living cells by virtue of its wide field of view, fast imaging and low phototoxicity. However, a high-quality super-resolution image requires accurate parameter estimation. Recently, we have proposed an efficient and robust SIM algorithm based on principal component analysis (PCA-SIM) that integrates iteration-free reconstruction, noise robustness, and limited computational complexity. Nevertheless, as with many parameter estimation algorithms, the performance of PCA-SIM may be affected when using high-frequency sinusoidal illumination and total internal reflection fluorescence (TIRF) objective. In this work, we present a parameter estimation method of combining cross-correlation and principal component analysis, capable of accurate sub-pixel precision estimation when the 1-order spectral information is lacking without iteration, promising to achieve high-speed, long-term, artifact-free super-resolution imaging of live cells.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Yuxia Huang, Jiaming Qian, Pengfei Fan, and Yongtao Liu "Parameter estimation algorithm based on the combination of cross-correlation and principal component analysis for structured illumination microscopy", Proc. SPIE 13153, Sixth Conference on Frontiers in Optical Imaging and Technology: Novel Technologies in Optical Systems, 131531G (30 April 2024); https://doi.org/10.1117/12.3019593

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