Characterization and effect of system noise in a differential angle of arrival measurement device

Arthur Howard Waldie; James J. Drexler; John A. Qualtrough; David B. Soules; Frank D. Eaton; William A. Peterson; John R. Hines

doi:10.1117/12.46555

1 July 1991 Characterization and effect of system noise in a differential angle of arrival measurement device

Arthur Howard Waldie, James J. Drexler, John A. Qualtrough, David B. Soules, Frank D. Eaton, William A. Peterson, John R. Hines

Author Affiliations +

Proceedings Volume 1487, Propagation Engineering: Fourth in a Series; (1991) https://doi.org/10.1117/12.46555
Event: Orlando '91, 1991, Orlando, FL, United States

Abstract

Various sources of noise associated with angle of arrival measurements are discussed and their effect is evaluated and compared to experimental determinations of system noise. The predominant source of system noise is found to arise from the charge transfer process on the CCD detector itself. Image motion variance measurements are linear to within 3% over the range of image motion encountered in ro measurements with a correlation coefficient greater than 99% when compared to a known reference.

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Arthur Howard Waldie, James J. Drexler, John A. Qualtrough, David B. Soules, Frank D. Eaton, William A. Peterson, and John R. Hines "Characterization and effect of system noise in a differential angle of arrival measurement device", Proc. SPIE 1487, Propagation Engineering: Fourth in a Series, (1 July 1991); https://doi.org/10.1117/12.46555

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