Convenient noncontact radius measurement using secondary moire properties

Hans-Joerg Heimbeck

doi:10.1117/12.134846

1 January 1992 Convenient noncontact radius measurement using secondary moire properties

Hans-Joerg Heimbeck

Proceedings Volume 1531, Advanced Optical Manufacturing and Testing II; (1992) https://doi.org/10.1117/12.134846
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The local radius of a reflecting surface can be measured by imaging a grating in a F-Theta- Setup. The radius is determined by measuring the grating period. That can be done in a moire technique where the reference grating is a moire itself. The reticule can be scaled for direct reading of the radius by using the properties of the secondary moire.

Citation Download Citation

Hans-Joerg Heimbeck "Convenient noncontact radius measurement using secondary moire properties", Proc. SPIE 1531, Advanced Optical Manufacturing and Testing II, (1 January 1992); https://doi.org/10.1117/12.134846

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available