Surface reflection coefficient correction technique for a microdisplacement OFS

Cailin Wei

doi:10.1117/12.50003

1 August 1991 Surface reflection coefficient correction technique for a microdisplacement OFS

Cailin Wei

Proceedings Volume 1572, International Conference on Optical Fibre Sensors in China OFS(C) '91; (1991) https://doi.org/10.1117/12.50003
Event: International Conference on Optical Fibre Sensors in China, 1991, Wuhan, China

Abstract

Because of the variation of the reflection coefficient, the measuring accuracy is greatly affected with the reflected optical fiber displacement sensor (OFDS). In this presentation, the author presents a new kind of sensing scheme which can correct the reflection coefficient in real time and make it possible to realize on-line measurement.

Citation Download Citation

Cailin Wei "Surface reflection coefficient correction technique for a microdisplacement OFS", Proc. SPIE 1572, International Conference on Optical Fibre Sensors in China OFS(C) '91, (1 August 1991); https://doi.org/10.1117/12.50003

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available